scanning electron microscopy (sem) equipment Search Results


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Carl Zeiss scanning electron microscopy (sem) equipped with an energy-dispersive x-ray spectroscopy (edx) detector zeiss 1530
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Scanning electron microscopy (SEM) images (5000×) of the reclaimed tile specimens with ( a ) 0% (W/O Waste Glass); ( b ) 10%; ( c ) 20%; ( d ) 40%; and ( e ) 60% waste glass replacement calcined at 1000 °C.

Journal: Materials

Article Title: Acid-Alkali Resistance of New Reclaimed Tiles Containing Sewage Sludge Ash and Waste Glass

doi: 10.3390/ma9070546

Figure Lengend Snippet: Scanning electron microscopy (SEM) images (5000×) of the reclaimed tile specimens with ( a ) 0% (W/O Waste Glass); ( b ) 10%; ( c ) 20%; ( d ) 40%; and ( e ) 60% waste glass replacement calcined at 1000 °C.

Article Snippet: Scanning electron microscopy (SEM) equipment (model S-4700, Hitachi, Tokyo, Japan) was used to study the microstructure of the reclaimed tile specimens.

Techniques: Electron Microscopy